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Titolo:
Architecture for fault diagnosis of CMOS ICs with BIC based I-DDQ testing
Autore:
Segura, J; Isern, E; Roca, M;
Indirizzi:
Univ Balearic Isl, Dept Phys, E-07071 Palma de Mallorca, Spain Univ Balearic Isl Palma de Mallorca Spain E-07071 lma de Mallorca, Spain
Titolo Testata:
ELECTRONICS LETTERS
fascicolo: 14, volume: 35, anno: 1999,
pagine: 1152 - 1153
SICI:
0013-5194(19990708)35:14<1152:AFFDOC>2.0.ZU;2-D
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
--discip_EC--
Citazioni:
3
Recensione:
Indirizzi per estratti:
Indirizzo: Segura, J Univ Balearic Isl, Dept Phys, E-07071 Palma de Mallorca, Spain Univ Balearic Isl Palma de Mallorca Spain E-07071 lorca, Spain
Citazione:
J. Segura et al., "Architecture for fault diagnosis of CMOS ICs with BIC based I-DDQ testing", ELECTR LETT, 35(14), 1999, pp. 1152-1153

Abstract

An architecture for simplifying fault diagnosis is presented. The method is applied to circuits incorporating built-in current (BIC) sensors and is based on hardware partitioning, does not increase the number of pins and is independent of the fault diagnosis heuristic at the logic level.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 06/04/20 alle ore 01:38:06