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Titolo:
Interfacial roughness in a near-critical binary fluid mixture: X-ray reflectivity and near-specular diffuse scattering
Autore:
McClain, BR; Yoon, M; Litster, JD; Mochrie, SGJ;
Indirizzi:
MIT, Dept Phys, Cambridge, MA 02139 USA MIT Cambridge MA USA 02139MIT, Dept Phys, Cambridge, MA 02139 USA
Titolo Testata:
EUROPEAN PHYSICAL JOURNAL B
fascicolo: 1, volume: 10, anno: 1999,
pagine: 45 - 52
SICI:
1434-6028(199907)10:1<45:IRIANB>2.0.ZU;2-S
Fonte:
ISI
Lingua:
ENG
Soggetto:
CAPILLARY WAVES; CRITICAL-POINT; FLUCTUATIONS; SURFACE; TRANSITIONS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
31
Recensione:
Indirizzi per estratti:
Indirizzo: McClain, BR Harvard Univ, Dept Cellular & Mol Biol, Cambridge, MA 02138 USA Harvard Univ Cambridge MA USA 02138 , Cambridge, MA 02138 USA
Citazione:
B.R. McClain et al., "Interfacial roughness in a near-critical binary fluid mixture: X-ray reflectivity and near-specular diffuse scattering", EUR PHY J B, 10(1), 1999, pp. 45-52

Abstract

Measurements are presented of the X-ray specular reflectivity and near-specular diffuse scattering of the interface in a near-critical mixture of hexane and perfluorohexaae. A lineshape analysis of the scattered intensity ateach temperature yields Values for the interfacial tension and interfacialwidth. The temperature variation of the tension and width so-obtained are consistent with current understanding of this interface, which holds that there is, firstly, an intrinsic width over which the fluid density Varies smoothly from one coexistence composition to the other; and, secondly, that the interface acquires an additional and larger statistical interfacial width as a result of capillary fluctuations.

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Documento generato il 19/09/20 alle ore 20:23:14