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Titolo:
Feasibility studies on a nanometric oscillator fabricated by surface diffusion for use as a force detector in scanning force microscopy
Autore:
Kawakatsu, H; Saya, D; de Labachelerie, M; Hue, HJ; Guntherodt, HJ;
Indirizzi:
Univ Tokyo, Inst Ind Sci, Minato Ku, Tokyo 1068558, Japan Univ Tokyo Tokyo Japan 1068558 Ind Sci, Minato Ku, Tokyo 1068558, Japan Lab Phys & Metrol Oscillateurs, CNRS, F-25044 Besancon, France Lab Phys & Metrol Oscillateurs Besancon France F-25044 Besancon, France Univ Basel, Inst Phys, CH-4056 Basel, Switzerland Univ Basel Basel Switzerland CH-4056 st Phys, CH-4056 Basel, Switzerland
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
fascicolo: 6B, volume: 38, anno: 1999,
pagine: 3954 - 3957
SICI:
0021-4922(199906)38:6B<3954:FSOANO>2.0.ZU;2-D
Fonte:
ISI
Lingua:
ENG
Soggetto:
TUNNELING MICROSCOPE; DEVICES;
Keywords:
scanning force microscopy; surface science; nanocantilever; noncontact atomic force microscopy;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
19
Recensione:
Indirizzi per estratti:
Indirizzo: Kawakatsu, H Univ Tokyo, Inst Ind Sci, Minato Ku, Rappongi 7-22-1, Tokyo 1068558, Japan Univ Tokyo Rappongi 7-22-1 Tokyo Japan 1068558 068558, Japan
Citazione:
H. Kawakatsu et al., "Feasibility studies on a nanometric oscillator fabricated by surface diffusion for use as a force detector in scanning force microscopy", JPN J A P 1, 38(6B), 1999, pp. 3954-3957

Abstract

A metal bail supported by a nanometric filiform neck, made by surface diffusion-in vacuum, has the potential to be used as an oscillating force detector in scanning force microscopy. Although in most cases, the oscillator isextremely fragile and does not survive the transport from one vacuum chamber to the other, there still remains the possibility that it can be used iffabricated and utilized in situ. With the aim of characterizing the oscillator without breaking the vacuum, we have made a scanning tunneling/force microscope(STM, SFM) with a heating filament for fabrication of the oscillator in a scanning electron microscope (SEM). The formation of the oscillatorwas observed with the SEM, and then, the tip of the STM/SFM was used for the application of force to verify ifs feasibility as an oscillator.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 25/09/20 alle ore 08:05:19