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Titolo:
Surface texture parameters as a tool to measure image quality in scanning probe microscope
Autore:
Anguiano, E; Oliva, AI; Aguilar, M;
Indirizzi:
CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain CSIC Madrid Spain E-28049CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain IPN, CINVESTAV, Unidad Merida, Merida 97310, Yucatan, Mexico IPN Merida Yucatan Mexico 97310 dad Merida, Merida 97310, Yucatan, Mexico Univ Autonoma Madrid, Escuela Tecn Super Informat, E-28049 Madrid, Spain Univ Autonoma Madrid Madrid Spain E-28049 nformat, E-28049 Madrid, Spain
Titolo Testata:
ULTRAMICROSCOPY
fascicolo: 3-4, volume: 77, anno: 1999,
pagine: 195 - 205
SICI:
0304-3991(199907)77:3-4<195:STPAAT>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Soggetto:
FRACTAL CHARACTERIZATION; FREQUENCY-ANALYSIS; TUNNELING-MICROSCOPY;
Keywords:
roughness; surface texture; scanning microscopy; STM; SPM; AFM;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Life Sciences
Physical, Chemical & Earth Sciences
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Aguilar, M CSIC, Inst Ciencia Mat, Campus CSIC, E-28049 Madrid, Spain CSICCampus CSIC Madrid Spain E-28049 C, E-28049 Madrid, Spain
Citazione:
E. Anguiano et al., "Surface texture parameters as a tool to measure image quality in scanning probe microscope", ULTRAMICROS, 77(3-4), 1999, pp. 195-205

Abstract

The behavior of the texture parameters of surfaces imaged by scanning tunneling microscopy (STM) under different control conditions in the feedback loop is shown. The analysis of the main surface texture parameters such as the rms-roughness, the skewness, the kurtosis and the average wavelength obtained from STM images shows that they have a strong dependence on the values of the parameters used in the feedback loop for imaging regardless of thevisual quality of the images that can be the same. Thus, surface texture parameters can be used to measure image quality in STM in relation to two nondimensional parameters (G and K) that described the measurement conditions. (C) 1999 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 29/03/20 alle ore 18:13:27