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Titolo:
The importance of multiple scattering pathways through the central atom inthe analysis of metal K-edge XAFS data of coordination complexes
Autore:
Binsted, N; van der Gaauw, A; Wilkin, OM; Young, NA;
Indirizzi:
Univ Hull, Dept Chem, Hull HU6 7RX, N Humberside, England Univ Hull Hull N Humberside England HU6 7RX U6 7RX, N Humberside, England
Titolo Testata:
JOURNAL OF SYNCHROTRON RADIATION
, volume: 6, anno: 1999,
parte:, 3
pagine: 239 - 241
SICI:
0909-0495(19990501)6:<239:TIOMSP>2.0.ZU;2-L
Fonte:
ISI
Lingua:
ENG
Soggetto:
ABSORPTION FINE-STRUCTURE; EXAFS; MATRIX;
Keywords:
XAFS; multiple scattering; NiK-edge; bond angle determinations;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Binsted, N Univ Hull, Dept Chem, Hull HU6 7RX, N Humberside, England Univ Hull Hull N Humberside England HU6 7RX umberside, England
Citazione:
N. Binsted et al., "The importance of multiple scattering pathways through the central atom inthe analysis of metal K-edge XAFS data of coordination complexes", J SYNCHROTR, 6, 1999, pp. 239-241

Abstract

Features at twice the metal-ligand distance in the Fourier transforms of metal K-edge XAFS data are demonstrated to be due to multiple scattering pathways involving the central metal atom, and to be very sensitive to bond angle.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 28/11/20 alle ore 15:09:25