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Titolo:
Optical low-coherence reflectometer for measuring WDM components
Autore:
Mechels, S; Takada, K; Okamoto, K;
Indirizzi:
NTT, Optoelect Labs, Ibaraki, Osaka 3191193, Japan NTT Ibaraki Osaka Japan 3191193 elect Labs, Ibaraki, Osaka 3191193, Japan
Titolo Testata:
IEEE PHOTONICS TECHNOLOGY LETTERS
fascicolo: 7, volume: 11, anno: 1999,
pagine: 857 - 859
SICI:
1041-1135(199907)11:7<857:OLRFMW>2.0.ZU;2-6
Fonte:
ISI
Lingua:
ENG
Keywords:
integrated optics; optical interferometry; optical planar waveguide components; optical reflection; wavelength-division multiplexing;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
5
Recensione:
Indirizzi per estratti:
Indirizzo: Mechels, S Natl Inst Stand & Technol, 325 Broadway, Boulder, CO 80303 USA Natl Inst Stand & Technol 325 Broadway Boulder CO USA 80303 USA
Citazione:
S. Mechels et al., "Optical low-coherence reflectometer for measuring WDM components", IEEE PHOTON, 11(7), 1999, pp. 857-859

Abstract

We developed an optical low coherence reflectometer (OLCR) that is specialized for measuring wavelength dependent reflectances from wavelength division multiplexed components. The system is a complex: OLCR (uses fringes and Fourier transform spectroscopy to obtain phase information) and is superiorto conventional (envelope detection) OLCR in that reflected phase information can be used to resolve the reflectance amplitudes within narrow spectral windows. The system also contains several improvements over previous complex OLCR configurations, including a copropagating reference signal for minimum fringe degradation and a polarization diversity detection scheme. We used the system to measure internal reflections from several arrayed-waveguide gratings.

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Documento generato il 28/11/20 alle ore 04:54:05