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Titolo:
Automated ADC characterization using the histogram test stimulated by Gaussian noise
Autore:
Martins, RC; Serra, AMD;
Indirizzi:
Inst Super Tecn, Inst Telecomunicacoes, P-1096 Lisbon, Portugal Inst SuperTecn Lisbon Portugal P-1096 nicacoes, P-1096 Lisbon, Portugal
Titolo Testata:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
fascicolo: 2, volume: 48, anno: 1999,
pagine: 471 - 474
SICI:
0018-9456(199904)48:2<471:AACUTH>2.0.ZU;2-C
Fonte:
ISI
Lingua:
ENG
Keywords:
analog-to-digital conversion; Gaussian noise; statistical testing; white noise;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
Citazioni:
6
Recensione:
Indirizzi per estratti:
Indirizzo: Martins, RC Inst Super Tecn, Inst Telecomunicacoes, P-1096 Lisbon, Portugal Inst Super Tecn Lisbon Portugal P-1096 1096 Lisbon, Portugal
Citazione:
R.C. Martins e A.M.D. Serra, "Automated ADC characterization using the histogram test stimulated by Gaussian noise", IEEE INSTR, 48(2), 1999, pp. 471-474

Abstract

A broadband variant of the histogram test where Gaussian noise is used as a stimulus signal is presented. A methodology allowing for an automated andextensive characterization of analog-to-digital converers (ADC's) is given. Tolerance and confidence intervals are determined both for the integral nonlinearity (INL) and differential nonlinearity (DNL) vectors, related to the number of samples acquired. Experimental results of the characterizationof a VXI waveform digitizer using this methodology are shown.

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Documento generato il 25/09/20 alle ore 06:13:10