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Titolo:
Characterisation of interfacial properties in sputtered Co Cu multilayers:X-ray reflectometry compared with TEM and AFM
Autore:
Langer, J; Krausslich, J; Mattheis, R; Senz, S; Hesse, D;
Indirizzi:
Inst Phys Hochtechnol Jena eV, D-07702 Jena, Germany Inst Phys HochtechnolJena eV Jena Germany D-07702 D-07702 Jena, Germany Univ Jena, Inst Opt & Quantenelektr, D-07743 Jena, Germany Univ Jena Jena Germany D-07743 pt & Quantenelektr, D-07743 Jena, Germany Max Planck Inst Mikrostrukturphys, D-06120 Halle, Germany Max Planck Inst Mikrostrukturphys Halle Germany D-06120 0 Halle, Germany
Titolo Testata:
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
, volume: 199, anno: 1999,
pagine: 644 - 646
SICI:
0304-8853(199906)199:<644:COIPIS>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
CO/CU MULTILAYERS; GMR MULTILAYERS; LAYERS;
Keywords:
TEM; X-ray reflectometry; AFM; GMR;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
8
Recensione:
Indirizzi per estratti:
Indirizzo: Mattheis, R Inst Phys Hochtechnol Jena eV, Postfach 100 239, D-07702 Jena,Germany Inst Phys Hochtechnol Jena eV Postfach 100 239 Jena Germany D-07702
Citazione:
J. Langer et al., "Characterisation of interfacial properties in sputtered Co Cu multilayers:X-ray reflectometry compared with TEM and AFM", J MAGN MAGN, 199, 1999, pp. 644-646

Abstract

Combining localised and global structural information we suggest that differences in the maenetoresistive effect in the first maximum of antiferromagnetic coupling in Co/Cu multilayers can be attributed to the number of magnetic shortcuts localised at grain boundaries. In particular evidence is given that the increased rms-roughness in samples without buffer as compared to samples grown on a Fe buffer can be attributed to a break off of the multilayer structure in adjacent grains. (C) 1999 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 18/09/20 alle ore 17:04:01