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Titolo:
Structural and dielectric properties of Bi4Ti3O12 thin films prepared by metalorganic solution deposition
Autore:
Wang, XS; Zhang, YJ; Zhang, LY; Yao, X;
Indirizzi:
Xidian Univ, Dept Tech Phys, Xian 710071, Peoples R China Xidian Univ Xian Peoples R China 710071 ys, Xian 710071, Peoples R China Xian Jiao Tong Univ, Elect Mat Res Lab, Xian 710049, Peoples R China Xian Jiao Tong Univ Xian Peoples R China 710049 710049, Peoples R China
Titolo Testata:
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
fascicolo: 5, volume: 68, anno: 1999,
pagine: 547 - 552
SICI:
0947-8396(199905)68:5<547:SADPOB>2.0.ZU;2-N
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
19
Recensione:
Indirizzi per estratti:
Indirizzo: Wang, XS Xidian Univ, Dept Tech Phys, Xian 710071, Peoples R China Xidian Univ Xian Peoples R China 710071 710071, Peoples R China
Citazione:
X.S. Wang et al., "Structural and dielectric properties of Bi4Ti3O12 thin films prepared by metalorganic solution deposition", APPL PHYS A, 68(5), 1999, pp. 547-552

Abstract

Ferroelectric Bi4Ti3O12 thin films with single phase and nanosized microstructure were prepared on Pt/Ti/SiO2/Si(111) substrate by metalorganic solution deposition using titanium butoxide and bismuth nitrate at relatively low annealing temperatures. The internal strain in Bi4Ti3O12 thin films was calculated from the peak shifts and broadening of XRD patterns. With increase in annealing temperature, the uniform strain decreased from positive to zero and then to negative, and the non-uniform strain decreased and was negative. The total strain was negative and in the range of -0.2%--1.0%, from which the stress of the films was calculated to be about -1.4 x 10(9) N/m(2). The mode values of strain decreased with increase in annealing temperature and increased with increase in film thickness. The dielectric constant increased with increase in annealing temperature and him thickness. The dielectric properties were interpreted by considering the influence of strain, grain size, and grain boundaries. The strain lowered the polarization and increased the dielectric constant. The larger the grain size and the thinner the grain boundary, the greater the dielectric constant. The influence of grain size and grain boundary was stronger than that of the strain.

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Documento generato il 11/07/20 alle ore 17:15:28