Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Growth of YBa2Cu3O7-x/BaxSr1-xTiO3/LaAlO3 heterostructures by injection MOCVD for microwave applications
Autore:
Lindner, J; Weiss, F; Senateur, JP; Galindo, V; Haessler, W; Weihnacht, M; Santiso, J; Figueras, A;
Indirizzi:
EcoleF-38402uper Phys Grenoble, Mat & Genie Phys Lab, INPG, UMR 5628 CNRS,Ecole Natl Super Phys Grenoble St Martin Dheres France F-38402 628 CNRS, IFW Dresden, Inst Met Werkstoffe, Dresden, Germany IFW Dresden Dresden Germany sden, Inst Met Werkstoffe, Dresden, Germany ICMAB, CSIC, Bellaterra, Spain ICMAB Bellaterra SpainICMAB, CSIC, Bellaterra, Spain
Titolo Testata:
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
fascicolo: 6-7, volume: 19, anno: 1999,
pagine: 1435 - 1437
SICI:
0955-2219(1999)19:6-7<1435:GOYHBI>2.0.ZU;2-W
Fonte:
ISI
Lingua:
ENG
Keywords:
BaxSr1-xTiO3; films; X-ray methods; electrical properties;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
5
Recensione:
Indirizzi per estratti:
Indirizzo: Lindner, J EcoleBPatl Super Phys Grenoble, Mat & Genie Phys Lab, INPG, UMR5628 CNRS, Ecole Natl Super Phys Grenoble BP 46 St Martin Dheres France F-38402
Citazione:
J. Lindner et al., "Growth of YBa2Cu3O7-x/BaxSr1-xTiO3/LaAlO3 heterostructures by injection MOCVD for microwave applications", J EUR CERAM, 19(6-7), 1999, pp. 1435-1437

Abstract

It is well known that including dielectrics in layered structures such as YBa2Cu3O7-x/BaxSr1-xTiO3/LaAlO3 could be used as a basis for devices with voltage control of microwave circuit parameters. In this study BaxSr1-xTiO3 (BST) (x=0 to 1) thin films have been epitaxially gr own on LaAlO3 at a substrate temperature of 800 degrees C using a new liquid source delivery technique called injection MOCVD. This process, based on computer-controlled injection of micro-amounts of liquid droplets, gives rise to BST thin films with their (100) orientation perpendicular to the substrate displaying a FWHM of as low as 0.14 degrees for the 002 diffraction omega scan. AFM studiesof the films, surface morphology revealed a smooth surface. In a next stepdielectric properties are discussed Finally, the possibility of obtaining YBa2Cu3O7-x/BaxSr1-xTiO3/LaAlO3 heterostructures was investigated resultingin quite promising values for the critical temperature T-c of 88 K for theYBCO films. (C) 1999 Published by Elsevier Science Limited. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/12/20 alle ore 10:35:23