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Titolo:
QUANTITATIVE CRITERIA FOR THE DETECTION AND CHARACTERIZATION OF NANOCRYSTALS FROM HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGES
Autore:
HYTCH MJ; GANDAIS M;
Indirizzi:
CNRS,CTR ETUD CHIM MET,15 RUE G URBAIN F-94407 VITRY FRANCE UNIV PARIS 06,MINEROL & CRISTALLOG LAB PARIS FRANCE
Titolo Testata:
Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties
fascicolo: 3, volume: 72, anno: 1995,
pagine: 619 - 634
SICI:
0141-8610(1995)72:3<619:QCFTDA>2.0.ZU;2-F
Fonte:
ISI
Lingua:
ENG
Soggetto:
AMORPHOUS MATERIALS; PARTICLES; SIZE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
16
Recensione:
Indirizzi per estratti:
Citazione:
M.J. Hytch e M. Gandais, "QUANTITATIVE CRITERIA FOR THE DETECTION AND CHARACTERIZATION OF NANOCRYSTALS FROM HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGES", Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 72(3), 1995, pp. 619-634

Abstract

A new method of high-resolution electron microscopy image analysis ispresented which improves considerably the visibility of nanocrystals in amorphous materials. The technique is based on individual Bragg filtering of the lattice fringes in the image. The significant feature isthat the amplitude and phase of the fringes as functions of position are calculated separately. This is similar to a holographic reconstruction with the Bragg interference representing the carrier wave. The phase information is shown to be particularly robust with respect to noise due to amorphous material. The images so produced are in a form suitable for statistical analysis, and criteria for judging quantitatively the extent of the crystal are proposed. The application of the technique to a wide range of similar problems concerning partially ordered materials is discussed.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 07/07/20 alle ore 22:10:04