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Titolo:
Effect of uniaxial anisotropy on anisotropic magnetoresistance: Thickness dependence in bilayer NiO(30 nm)/NiFe(t)
Autore:
Kim, DY; Kim, CG; Park, BS; Hwang, DG; Lee, SS;
Indirizzi:
Hyundai Elect Ind Co Ltd, Kyoungki 476860, South Korea Hyundai Elect Ind Co Ltd Kyoungki South Korea 476860 476860, South Korea Sun Moon Univ, Dept Phys, Chungnam 336840, South Korea Sun Moon Univ Chungnam South Korea 336840 , Chungnam 336840, South Korea Sangji Univ, Dept Phys, Wonju 220702, South Korea Sangji Univ Wonju South Korea 220702 ept Phys, Wonju 220702, South Korea
Titolo Testata:
JOURNAL OF APPLIED PHYSICS
fascicolo: 8, volume: 85, anno: 1999,
parte:, 2B
pagine: 5783 - 5785
SICI:
0021-8979(19990415)85:8<5783:EOUAOA>2.0.ZU;2-1
Fonte:
ISI
Lingua:
ENG
Soggetto:
EXCHANGE-ANISOTROPY; FILMS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
6
Recensione:
Indirizzi per estratti:
Indirizzo: Kim, DY Hyundai Elect Ind Co Ltd, Kyoungki 476860, South Korea Hyundai Elect Ind Co Ltd Kyoungki South Korea 476860 South Korea
Citazione:
D.Y. Kim et al., "Effect of uniaxial anisotropy on anisotropic magnetoresistance: Thickness dependence in bilayer NiO(30 nm)/NiFe(t)", J APPL PHYS, 85(8), 1999, pp. 5783-5785

Abstract

The uniaxial anisotropy field H-K and angle gamma from exchange coupling field in anisotropic magnetoresistance sample has been analyzed on the basisof the rotational magnetization of single domain. The anisotropy field HK in bilayer NiO(30 nm)/NiFe(t) obtained from the measured magnetoresistance profiles at magnetizing angle theta-0 degrees and 90 degrees from the exchange coupling field changes from positive to negative as the thickness of NiFe increases, transition at about 20 nm. The anisotropy field \H-K\, and angle gamma show a minimum values at the transition thickness, which is the optimum thickness in anisotropic magnetoresistance sample design in order toincrease the field sensitivity and reduces hysteresis loss. (C) 1999 American Institute of Physics. [S0021-8979(99)36408-2].

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Documento generato il 03/07/20 alle ore 01:41:30