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Titolo:
ZN K-EDGE EXAFS STUDY OF SILAR-GROWN ZINC-SULFIDE THIN-FILMS
Autore:
LINDROOS S; CHARREIRE Y; KANNIANINEN T; LESKELA M; BENAZETH S;
Indirizzi:
UNIV HELSINKI,DEPT CHEM,POB 55 FIN-00014 HELSINKI FINLAND UNIV PARIS 06 F-75252 PARIS 05 FRANCE UNIV PARIS 11,FAC PHARM,CHIM PHYS LAB,LURE F-91405 ORSAY FRANCE
Titolo Testata:
Journal of materials chemistry
fascicolo: 5, volume: 7, anno: 1997,
pagine: 741 - 745
SICI:
0959-9428(1997)7:5<741:ZKESOS>2.0.ZU;2-F
Fonte:
ISI
Lingua:
ENG
Soggetto:
ABSORPTION FINE-STRUCTURE; IONIC-LAYER ADSORPTION; SPECTROSCOPY; WATER;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
21
Recensione:
Indirizzi per estratti:
Citazione:
S. Lindroos et al., "ZN K-EDGE EXAFS STUDY OF SILAR-GROWN ZINC-SULFIDE THIN-FILMS", Journal of materials chemistry, 7(5), 1997, pp. 741-745

Abstract

Zinc sulfide thin films grown by the successive ionic layer adsorption and reaction (SILAR) method have been characterized by extended X-ray absorption fine structure(EXAFS) measurements. The ZnS films were well crystallized even as-grown but annealing improved the crystallinityclearly. The films contained small amounts of oxygen and, according to the EXAFS results, oxygen in the SILAR-grown zinc sulfide thin filmsoccurred as hydroxide ions both in the as-grown and in the annealed samples. The simulated radial distribution curves for two models, Zn(OH)(2)/ZnS and ZnO/ZnS, were calculated to analyse the film composition. The ZnS thin films were also characterized by IR and electron spectroscopy for chemical analysis (ESCA) measurements.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 09/07/20 alle ore 14:17:48