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Titolo:
ANALYSIS OF LATERAL FORCE CONTRIBUTION TO THE TOPOGRAPHY IN CONTACT MODE AFM
Autore:
SHANG G; QIU X; WANG C; BAI C;
Indirizzi:
CHINESE ACAD SCI,INST CHEM BEIJING 100080 PEOPLES R CHINA CHINESE ACAD SCI,INST CHEM BEIJING 100080 PEOPLES R CHINA
Titolo Testata:
Applied physics A: Materials science & processing
, volume: 66, anno: 1998,
parte:, 1 supplemento:, S
pagine: 333 - 335
SICI:
0947-8396(1998)66:<333:AOLFCT>2.0.ZU;2-U
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC-SCALE FRICTION; MICROSCOPE; GRAPHITE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
G. Shang et al., "ANALYSIS OF LATERAL FORCE CONTRIBUTION TO THE TOPOGRAPHY IN CONTACT MODE AFM", Applied physics A: Materials science & processing, 66, 1998, pp. 333-335

Abstract

We employed a simple method to quantitatively analyze normal and lateral forces in contact mode AFM with the laser-beam deflection system. Taking into account the behavior of the cantilever and properties of the sample surface, the relationship between the applied forces and theproperties (the local slope and local friction coefficient) of the surface have been established. It is shown that the lateral force could be playing an important role in cantilever deflection and could resultin significant distortion of the topographic images. This work may benefit the analysis of the surface topography obtained by contact mode AFM.

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Documento generato il 02/12/20 alle ore 14:03:46