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Titolo:
STRESS-INDUCED DEPOLARIZATION IN PZT THIN-FILMS, MEASURED BY MEANS OFELECTRIC FORCE MICROSCOPY
Autore:
FRANKE K; HUELZ H; WEIHNACHT M;
Indirizzi:
INST FESTKORPER & WERKSTOFFORSCH DRESDEN EV,POSTFACH 270016 D-01171 DRESDEN GERMANY
Titolo Testata:
Surface science
fascicolo: 1-2, volume: 416, anno: 1998,
pagine: 59 - 67
SICI:
0039-6028(1998)416:1-2<59:SDIPTM>2.0.ZU;2-R
Fonte:
ISI
Lingua:
ENG
Soggetto:
MEASUREMENT SIGNALS; POLAR SUBSTANCES; POLING BEHAVIOR; DOMAINS;
Keywords:
ATOMIC FORCE MICROSCOPY; DEPOLARIZATION EFFECTS (DIELECTRICS); FERROELASTICITY; HYSTERESIS FERROELECTRICITY; POLARIZATION DIELECTRIC; THIN FILMS DIELECTRIC;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
18
Recensione:
Indirizzi per estratti:
Citazione:
K. Franke et al., "STRESS-INDUCED DEPOLARIZATION IN PZT THIN-FILMS, MEASURED BY MEANS OFELECTRIC FORCE MICROSCOPY", Surface science, 416(1-2), 1998, pp. 59-67

Abstract

During the procedure of poling selected crystallites on thin ferroelectric lead zirconate titanate films (PZT) by means of an electric scanning force microscope (EFM), strong depolarization vertical to the himhas been found. This can be shown to be due to stress induced effects, and the stress can be quantified. The stress originates from Maxwellstress between the EFM-tip and the dielectric sample. It has been found that the depolarization is set off at 93 MPa and continues until 260 MPa. The ferroelectric behaviour of the films is not damaged, and the poling behaviour remains reproducible. As explained, the field- and stress-induced poling characteristics can be ascribed to domain reorientation processes. Therefore, EFM can characterize domain configurations by means of stress dependent polarization measurements. This is true even if the domains cannot be resolved because of their small dimensions. The use of stress dependent polarization measurements significantly extends the efficiency of EF microscopy. (C) 1998 Elsevier ScienceB.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 01/12/20 alle ore 10:42:22