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Titolo:
HOW TO EXTRACT SPONTANEOUS POLARIZATION INFORMATION FROM EXPERIMENTAL-DATA IN ELECTRIC FORCE MICROSCOPY
Autore:
FRANKE K; HUELZ H; WEIHNACHT M;
Indirizzi:
INST FESTKORPER & WERKSTOFFORSCH DRESDEN EV,POSTFACH 270016 D-01171 DRESDEN GERMANY
Titolo Testata:
Surface science
fascicolo: 1-2, volume: 415, anno: 1998,
pagine: 178 - 182
SICI:
0039-6028(1998)415:1-2<178:HTESPI>2.0.ZU;2-H
Fonte:
ISI
Lingua:
ENG
Soggetto:
MEASUREMENT SIGNALS; POLAR SUBSTANCES; DOMAINS; FILMS;
Keywords:
FERROELECTRICITY; MICROSCOPY ATOMIC FORCE; POLARIZATION DIELECTRIC; THIN FILMS DIELECTRIC;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
7
Recensione:
Indirizzi per estratti:
Citazione:
K. Franke et al., "HOW TO EXTRACT SPONTANEOUS POLARIZATION INFORMATION FROM EXPERIMENTAL-DATA IN ELECTRIC FORCE MICROSCOPY", Surface science, 415(1-2), 1998, pp. 178-182

Abstract

To derive the spontaneous polarization of a sample, the first harmonic signal of the electric force microscope (EFM) must be corrected using the permittivity. This can be deduced from a simple EFM-force model and has been verified in experiments. For thin films of high permittivity, any gap of air between the tip and the sample prevents the accurate measurement of the permittivity. Therefore, the contact mode of EFMhas to be chosen for measurements of the spontaneous polarization of such films. (C) 1998 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/12/20 alle ore 10:01:20