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Titolo:
X-RAY REFLECTIVITY OF THE CU(11O) SURFACE
Autore:
HELGESEN G; GIBBS D; BADDORF AP; ZEHNER DM; MOCHRIE SGJ;
Indirizzi:
BROOKHAVEN NATL LAB,DEPT PHYS UPTON NY 11973 OAK RIDGE NATL LAB,DIV SOLID STATE OAK RIDGE TN 37831 MASSACHUSETTS INST TECHNOL,DEPT PHYS CAMBRIDGE MA 02139
Titolo Testata:
Physical review. B, Condensed matter
fascicolo: 20, volume: 48, anno: 1993,
pagine: 15320 - 15325
SICI:
0163-1829(1993)48:20<15320:XROTCS>2.0.ZU;2-B
Fonte:
ISI
Lingua:
ENG
Soggetto:
ENERGY ELECTRON-DIFFRACTION; COPPER 110 SURFACE; ROUGHENING TRANSITION; ION-SCATTERING; ENHANCED ANHARMONICITY; OSCILLATORY RELAXATION; COMPUTER-SIMULATION; DISORDER; AG(110);
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
35
Recensione:
Indirizzi per estratti:
Citazione:
G. Helgesen et al., "X-RAY REFLECTIVITY OF THE CU(11O) SURFACE", Physical review. B, Condensed matter, 48(20), 1993, pp. 15320-15325

Abstract

The specular reflectivity from the (110) surface of a Cu single crystal has been measured for temperatures between 300 and 1100 K. At lowertemperatures, the reflectivity is well described by a model which yields a contraction of the spacing between the first and the second surface layers by 8% relative to the bulk layer separation. The fits also show large surface-normal vibrational amplitudes within the first few atomic layers. The line shape of the scattering transverse to the specular direction has two components below 1000 K, and evolves with increasing temperature. However, our data do not preclude the existence of a surface-roughening transition.

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Documento generato il 20/09/20 alle ore 07:39:36