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Titolo:
INVESTIGATION OF ZNS THIN-FILMS ON SI(100) BY PHASE DETECTION IMAGINGAND YOUNGS MODULUS MICROSCOPY
Autore:
RESCH R; FRIEDBACHER G; GRASSERBANER M; LINDROOS S; KANNIAINEN T; VALKONEN MP; LESKELA M;
Indirizzi:
VIENNA UNIV TECHNOL,INST ANALYT CHEM,GETREIDEMARKT 9-151 A-1060 VIENNA AUSTRIA VIENNA UNIV TECHNOL,INST ANALYT CHEM A-1060 VIENNA AUSTRIA UNIV HELSINKI,DEPT CHEM FIN-00014 HELSINKI FINLAND
Titolo Testata:
Fresenius' journal of analytical chemistry
fascicolo: 6-7, volume: 361, anno: 1998,
pagine: 613 - 617
SICI:
0937-0633(1998)361:6-7<613:IOZTOS>2.0.ZU;2-8
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC-FORCE MICROSCOPY; MODULATION; GROWTH;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
R. Resch et al., "INVESTIGATION OF ZNS THIN-FILMS ON SI(100) BY PHASE DETECTION IMAGINGAND YOUNGS MODULUS MICROSCOPY", Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 613-617

Abstract

In this study phase detection imaging (PDI) and Young's modulus microscopy (YMM) have been used for investigation of ZnS thin films deposited on Si(100) substrates with successive ionic layer adsorption and reaction (SILAR). The additional information obtained by these techniques allows a better interpretation of the topographic images in the caseof the determination of the number of grains, their distribution and surface coverage. Moreover, the comparison between PDI and YMM is discussed in order to shed more light on the contrast mechanism in phase detection imaging.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 26/10/20 alle ore 04:02:26