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Titolo:
ELEMENTAL CHARACTERIZATION OF ELECTROLUMINESCENT SRS-CE THIN-FILMS
Autore:
LI WM; RITALA M; LESKELA M; LAPPALAINEN R; JOKINEN J; SOININEN E; HUTTL B; NYKANEN E; NIINISTO L;
Indirizzi:
UNIV HELSINKI,DEPT CHEM,INORGAN CHEM LAB,POB 55 FIN-00014 HELSINKI FINLAND UNIV HELSINKI,ACCELERATOR LAB FIN-00014 HELSINKI FINLAND PLANAR INT LTD FIN-02201 ESPOO FINLAND HEINRICH HERTZ INST NACHRICHTENTECH BERLIN GMBH,AG EL D-10117 BERLIN GERMANY HELSINKI UNIV TECHNOL,INORGAN & ANALYT CHEM LAB FIN-02015 ESPOO FINLAND
Titolo Testata:
Journal of applied physics
fascicolo: 2, volume: 84, anno: 1998,
pagine: 1029 - 1035
SICI:
0021-8979(1998)84:2<1029:ECOEST>2.0.ZU;2-Z
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC LAYER EPITAXY; DEVICES; PHOSPHOR; ALE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
34
Recensione:
Indirizzi per estratti:
Citazione:
W.M. Li et al., "ELEMENTAL CHARACTERIZATION OF ELECTROLUMINESCENT SRS-CE THIN-FILMS", Journal of applied physics, 84(2), 1998, pp. 1029-1035

Abstract

Impurities in SrS:Ce and SrS:Ce,Na thin films prepared by atomic layer epitaxy (ALE) and SrS:Ce,Mn,Cl prepared by reactive evaporation havebeen studied by combining various ion beam techniques, viz. Rutherford backscattering spectroscopy, nuclear resonance broadening, proton induced x-ray emission, particle induced gamma-ray emission, deuteron induced reactions and the two variants of elastic recoil detection analysis (ERDA), i.e., ERDA with an absorber and time-of-flight (TOF)-ERDA. In both ALE and reactively evaporated films the SrS or (Sr+Mn)/S ratios were close to unity and Ce concentrations varied from 0.1-0.4 at. %. The major impurities in the SrS bulk were found to be H, C, and O. The concentrations of these impurities in the state-of-the-art ALE SrS:Ce films were similar to 0.3 at. % for H, < 0.2 at. % for C and similar to 0.1 at. % for O, whereas 0.6-1.8 at. % H, 0.2-0.7 at. % C and 0.5-1.8 at. % O were found from the films prepared by the reactive evaporation. In the ALE SrS:Ce samples high electroluminescence (EL) brightness was found to correlate with low overall impurity content. However,though reactively evaporated SrS:Ce,Mn,Cl films contain higher level of impurities, they usually have better EL brightness than the ALE made SrS:Ce films. In many ALE SrS:Ce,Na samples Na was found to concentrate at the interface between upper insulator and the SrS:Ce,Na film. The EL performances of the corresponding thin-film electroluminescent stacks were poor. (C) 1998 American Institute of Physics. [S0021-8979(98)04214-5].

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Documento generato il 23/09/20 alle ore 13:02:06