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Titolo:
X-RAY SPECULAR-REFLECTIVITY STUDY OF THE LIQUID-VAPOR DENSITY PROFILEOF HE-4
Autore:
LURIO LB; RABEDEAU TA; PERSHAN PS; SILVERA IF; DEUTSCH M; KOSOWSKY SD; OCKO BM;
Indirizzi:
RENSSELAR POLYTECH INST,DEPT PHYS TROY NY 12180 HARVARD UNIV,DEPT PHYS CAMBRIDGE MA 02138 HARVARD UNIV,DIV APPL SCI CAMBRIDGE MA 02138 BAR ILAN UNIV,DEPT PHYS IL-52100 RAMAT GAN ISRAEL BROOKHAVEN NATL LAB,DEPT PHYS UPTON NY 11973
Titolo Testata:
Physical review. B, Condensed matter
fascicolo: 13, volume: 48, anno: 1993,
pagine: 9644 - 9659
SICI:
0163-1829(1993)48:13<9644:XSSOTL>2.0.ZU;2-T
Fonte:
ISI
Lingua:
ENG
Soggetto:
SURFACE-PROPERTIES; HELIUM FILMS; SCATTERING; SILICON; ATOMS; ROUGH;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
49
Recensione:
Indirizzi per estratti:
Citazione:
L.B. Lurio et al., "X-RAY SPECULAR-REFLECTIVITY STUDY OF THE LIQUID-VAPOR DENSITY PROFILEOF HE-4", Physical review. B, Condensed matter, 48(13), 1993, pp. 9644-9659

Abstract

The helium liquid-vapor interfacial density profile has been measuredwith x-ray specular reflectivity. Measurements were performed on thick films of helium adsorbed onto atomically flat silicon substrates. Both the amplitude and the phase of the complex scattering amplitude of the helium-vapor interface were obtained from measured interference between reflections from the helium liquid-vapor interface and the silicon-helium interface. Films whose thickness varied from 15 angstrom to 220 angstrom over a range of temperatures from 1.1 K to 3.0 K were studied. At T = 1.13 K the film thickness is 215 angstrom and the interfacial width is 9.2+/-1 angstrom. No significant variation was seen in the interfacial widths measured at temperatures between 1.1 K and 1.8 K. Analysis of these measurements indicates that the interface is asymmetric, with the decay of the density into the vapor having the sharperfalloff. The zero-K interfacial width extrapolated from the finite-temperature measurements with a quantized capillary-wave theory is 7.6(-2)+1 angstrom.

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Documento generato il 10/07/20 alle ore 08:48:49