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Titolo:
GENERALIZED-BARRIER PARAMETERS FOR SINGLE-BARRIER STRUCTURES AND RESONANCE WIDTH IN ASYMMETRICAL DOUBLE-BARRIER STRUCTURES
Autore:
ZHAO XD; YAMAMOTO H; TANIGUCHI K;
Indirizzi:
FUKUI UNIV,DEPT INFORMAT SCI,3-9-1 BUNKYO FUKUI 910 JAPAN
Titolo Testata:
Superlattices and microstructures
fascicolo: 6, volume: 23, anno: 1998,
pagine: 1309 - 1322
SICI:
0749-6036(1998)23:6<1309:GPFSSA>2.0.ZU;2-2
Fonte:
ISI
Lingua:
ENG
Soggetto:
MASS VARIATION; SUPERLATTICE;
Keywords:
RESONANCE CONDITION; GENERALIZED-BARRIER PARAMETERS; RESONANCE WIDTHS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
18
Recensione:
Indirizzi per estratti:
Citazione:
X.D. Zhao et al., "GENERALIZED-BARRIER PARAMETERS FOR SINGLE-BARRIER STRUCTURES AND RESONANCE WIDTH IN ASYMMETRICAL DOUBLE-BARRIER STRUCTURES", Superlattices and microstructures, 23(6), 1998, pp. 1309-1322

Abstract

Generalized-barrier parameters are studied theoretically for rectangular and trapezoidal single-barriers as well as parallel-plane ones, which are basic units for double-barrier and multiple-barrier structures. Analytical expressions for these parameters are derived by taking into account the position-dependent effective-mass effect. Furthermore, the expressions for the generalized-barrier parameters of optical single-layer thin film structures are considered and permit direct application of previous results to thin film interference filters also. The heights of resonant peaks and the resonance widths in asymmetrical double-barrier structures are studied as functions of the generalized-barrier parameters. (C) 1998 Academic Press Limited.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/01/20 alle ore 07:07:08