Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
NONLINEAR-OPTICAL PHENOMENA ON ROUGH SURFACES OF METAL THIN-FILMS
Autore:
POLIAKOV EY; MARKEL VA; SHALAEV VM; BOTET R;
Indirizzi:
NEW MEXICO STATE UNIV,DEPT PHYS LAS CRUCES NM 88003 RUSSIAN ACAD SCI,INST AUTOMAT & ELECTROMETRY,SIBERIAN BRANCH NOVOSIBIRSK 630090 RUSSIA NEW MEXICO STATE UNIV,DEPT PHYS LAS CRUCES NM 88003 UNIV PARIS 11,CTR ORSAY,PHYS SOLIDES LAB F-91405 ORSAY FRANCE
Titolo Testata:
Physical review. B, Condensed matter
fascicolo: 23, volume: 57, anno: 1998,
pagine: 14901 - 14913
SICI:
0163-1829(1998)57:23<14901:NPORSO>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Soggetto:
SCANNING-TUNNELING-MICROSCOPY; 2ND HARMONIC-GENERATION; DEPOSITED SILVER FILMS; 2ND-HARMONIC GENERATION; LIGHT-SCATTERING; FRACTAL CLUSTERS; ABSORPTION; INTERFACES; PARTICLE; GRAINS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
48
Recensione:
Indirizzi per estratti:
Citazione:
E.Y. Poliakov et al., "NONLINEAR-OPTICAL PHENOMENA ON ROUGH SURFACES OF METAL THIN-FILMS", Physical review. B, Condensed matter, 57(23), 1998, pp. 14901-14913

Abstract

Nonlinear optical phenomena on rough self-affine metal surfaces are theoretically studied. Placing nonlinearly polarizable molecules on such surfaces results in strong enhancement of optical nonlinearities. A quasistatic approximation is used to calculate local-enhancement factors for the second and third harmonic generation, degenerate four-wave mixing, and nonlinear Kerr effect. The calculations show that the average enhancement factors on a self-affine surface can be as large as. 10(7) and 10(15) for optical nonlinearities of the second and third order, respectively, with the maximum average enhancement in the infraredspectral range. Strong spatial inhomogeneity of local-enhancement distribution is demonstrated for the second and third harmonic generation. The local enhancement can exceed the average by several orders of magnitude, reaching; extremely high values. Sharp peaks in local-field intensities at fundamental and generated frequencies are localized in spatially separated nanometer-sized areas of the film.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 27/09/20 alle ore 22:08:14