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Titolo:
Low frequency light scattering in silica xerogels
Autore:
Fontana, A; Montagna, M; Rossi, F; Ferrari, M; Pelous, J; Terki, F; Woigner, T;
Indirizzi:
Univ Trent, Dipartimento Fis, I-38050 Trent, Italy Univ Trent Trent Italy I-38050 t, Dipartimento Fis, I-38050 Trent, Italy Ist Nazl Fis Mat, I-38050 Trent, Italy Ist Nazl Fis Mat Trent Italy I-38050 Nazl Fis Mat, I-38050 Trent, Italy Consiglio Nazl Ric CeFSA, Ctr Fis Stati Aggregati, I-38050 Trent, Italy Consiglio Nazl Ric CeFSA Trent Italy I-38050 egati, I-38050 Trent, Italy Univ Montpellier 2, Lab Verres, UMR5587, F-34095 Montpellier, France Univ Montpellier 2 Montpellier France F-34095 -34095 Montpellier, France
Titolo Testata:
JOURNAL OF PHYSICS-CONDENSED MATTER
fascicolo: 10A, volume: 11, anno: 1999,
pagine: A207 - A211
SICI:
0953-8984(19990315)11:10A<A207:LFLSIS>2.0.ZU;2-H
Fonte:
ISI
Lingua:
ENG
Soggetto:
VITREOUS SILICA; MODES; RAMAN; GEL;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
13
Recensione:
Indirizzi per estratti:
Indirizzo: Fontana, A Univ Trent, Dipartimento Fis, I-38050 Trent, Italy Univ Trent Trent Italy I-38050 ento Fis, I-38050 Trent, Italy
Citazione:
A. Fontana et al., "Low frequency light scattering in silica xerogels", J PHYS-COND, 11(10A), 1999, pp. A207-A211

Abstract

New Brillouin and Raman scattering measurements on silica xerogels in a wide range of densities (0.5-2.2 g cm(-3)) are compared among each other and with data in melt quenched vitreous silica, in the 10-750 K temperature region. In the low frequency part of the Raman spectra, the boson peak characteristic of glasses is observed for all studied densities at tow and high temperature when the quasielastic contribution is negligible. The results provide strong evidence of the presence of water in the pores of the silica skeleton.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 30/11/20 alle ore 09:42:48