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Titolo:
ION-BEAM ANALYSIS OF HIGH-TEMPERATURE SUPERCONDUCTING SAMPLES
Autore:
NATH N; RAUHALA E; DAHINWAL OP; RANI A; RAISANEN J; GUPTA AK;
Indirizzi:
KURUKSHETRA UNIV,DEPT PHYS KURUKSHETRA 132119 HARYANA INDIA
Titolo Testata:
Applied radiation and isotopes
fascicolo: 2, volume: 45, anno: 1994,
pagine: 191 - 197
SICI:
0969-8043(1994)45:2<191:IAOHSS>2.0.ZU;2-4
Fonte:
ISI
Lingua:
ENG
Soggetto:
HIGH-TC SUPERCONDUCTORS; O COMPOUND SYSTEM; GAMMA-RAY YIELDS; BACKSCATTERING ANALYSIS; ELASTIC BACKSCATTERING; CROSS-SECTIONS; HEAVY-IONS; OXYGEN; LA; RESONANCE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
33
Recensione:
Indirizzi per estratti:
Citazione:
N. Nath et al., "ION-BEAM ANALYSIS OF HIGH-TEMPERATURE SUPERCONDUCTING SAMPLES", Applied radiation and isotopes, 45(2), 1994, pp. 191-197

Abstract

Characterization of high temperature superconducting film and bulk samples has been carried out using 2 MeV alpha-particle Rutherford backscattering, 2.4 MeV proton elastic scattering, 2.4 MeV proton-induced x-ray emission, 9 MeV proton induced gamma-ray emission and 100 MeV iodine elastic recoil detection analysis techniques. The objective was tocompare different ion beam based techniques for: (i) compositional analysis; and (ii) consistency of the results obtained for samples prepared using similar preparation methodology.

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Documento generato il 19/09/20 alle ore 12:51:34