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Titolo:
INVESTIGATION OF POLYSTYRENE NANOPARTICLES AND DNA-PROTEIN COMPLEXES BY AFM WITH IMAGE-RECONSTRUCTION
Autore:
LEE I; WANG X; ZHU CF; WANG C; BAI C;
Indirizzi:
UNIV HONG KONG,DEPT CHEM,FOKFULAM RD HONG KONG PEOPLES R CHINA CHINESE ACAD SCI,INST CHEM BEIJING 100080 PEOPLES R CHINA
Titolo Testata:
Applied surface science
fascicolo: 3-4, volume: 126, anno: 1998,
pagine: 281 - 286
SICI:
0169-4332(1998)126:3-4<281:IOPNAD>2.0.ZU;2-Q
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC-FORCE MICROSCOPY; TIP CHARACTERIZATION;
Keywords:
ATOMIC FORCE MICROSCOPE; POLYSTYRENE PARTICLE; DNA-PROTEIN COMPLEX; IMAGE RECONSTRUCTION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
11
Recensione:
Indirizzi per estratti:
Citazione:
I. Lee et al., "INVESTIGATION OF POLYSTYRENE NANOPARTICLES AND DNA-PROTEIN COMPLEXES BY AFM WITH IMAGE-RECONSTRUCTION", Applied surface science, 126(3-4), 1998, pp. 281-286

Abstract

The problems of tip-sample interactions are considered in atomic force microscope (AFM) images of comparatively simple polystyrene particles and thermally denatured DNA-protein complexes with the application of the blind reconstruction method. In the case of soft particles, we found a considerable reduction of the vertical dimension of the AFM image. In addition, we applied the same image reconstruction method on thermal denatured DNA HindIII and DNase I complexes to characterize the unusual appearance of the AFM image. In the process of image reconstruction, each tip geometry was extracted from the same original image with the reconstructed image. (C) 1998 Elsevier Science B.V.

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Documento generato il 24/11/20 alle ore 10:27:44