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Titolo:
ELLIPSOMETRIC PENETRATION OF TURBID MEDIA - DEPOLARIZATION AND SURFACE CHARACTERIZATION
Autore:
SILVERMAN MP; STRANGE W;
Indirizzi:
TRINITY COLL,DEPT PHYS,300 SUMMIT ST,MCEC 277 HARTFORD CT 06106
Titolo Testata:
Thin solid films
, volume: 313, anno: 1998,
pagine: 831 - 835
SICI:
0040-6090(1998)313:<831:EPOTM->2.0.ZU;2-U
Fonte:
ISI
Lingua:
ENG
Soggetto:
SCATTERING; LIGHT;
Keywords:
BACKSCATTERING; DEPOLARIZATION; IMAGING; PHASE MODULATION; POLARIZATION; TURBIDITY;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
6
Recensione:
Indirizzi per estratti:
Citazione:
M.P. Silverman e W. Strange, "ELLIPSOMETRIC PENETRATION OF TURBID MEDIA - DEPOLARIZATION AND SURFACE CHARACTERIZATION", Thin solid films, 313, 1998, pp. 831-835

Abstract

Ellipsometry can be used to reveal characteristics of solid surfaces imbedded in turbid layers. Using a photoelastic modulator (PEM) to record the linear and circular intensity differences (LID, CID) of backscattered light as a function of position across a sample cell, we have observed reflective, diffractive and absorptive surfaces immersed in optically dense aqueous suspensions of latex particles. (C) 1998 Elsevier Science S.A.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 29/09/20 alle ore 16:15:05