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Titolo:
X-RAY CHARACTERIZATION OF RB EXCHANGED KTP
Autore:
RAIZMAN A; EGER D; ORON M;
Indirizzi:
SOREQ NRC,DIV OPTOELECT IL-81800 YAVNE ISRAEL
Titolo Testata:
Journal of crystal growth
fascicolo: 2, volume: 187, anno: 1998,
pagine: 259 - 267
SICI:
0022-0248(1998)187:2<259:XCOREK>2.0.ZU;2-3
Fonte:
ISI
Lingua:
ENG
Soggetto:
POTASSIUM TITANYL PHOSPHATE; WAVE-GUIDES; BLUE-LIGHT; KTIOPO4; FABRICATION; GENERATION; ISOMORPHS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
24
Recensione:
Indirizzi per estratti:
Citazione:
A. Raizman et al., "X-RAY CHARACTERIZATION OF RB EXCHANGED KTP", Journal of crystal growth, 187(2), 1998, pp. 259-267

Abstract

The use of X-ray double crystal diffractometry for a nondestructive contactless determination of Rb concentration depth profile in Rb exchanged KTiOPO4 crystals is demonstrated. Two types of layers, relaxed and strained, can be formed via the exchange process, depending on the experimental conditions. In the latter case, the exchanged layer was found to be totally strained as was determined from measurement of asymmetric X-ray reflections. The Rb and strain distribution profiles were calculated using the (0 0 8) symmetric reflection. (C) 1998 Published by Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 30/10/20 alle ore 00:38:40