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Titolo:
STATISTICAL-ANALYSIS OF X-RAY SPECKLE AT THE NSLS
Autore:
TSUI OKC; MOCHRIE SGJ; BERMAN LE;
Indirizzi:
MIT,CTR MAT SCI & ENGN CAMBRIDGE MA 02139 BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE UPTON NY 11973
Titolo Testata:
Journal of synchrotron radiation
, volume: 5, anno: 1998,
parte:, 1
pagine: 30 - 36
SICI:
0909-0495(1998)5:<30:SOXSAT>2.0.ZU;2-6
Fonte:
ISI
Lingua:
ENG
Keywords:
X-RAY SPECKLE; COHERENT X-RAYS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
O.K.C. Tsui et al., "STATISTICAL-ANALYSIS OF X-RAY SPECKLE AT THE NSLS", Journal of synchrotron radiation, 5, 1998, pp. 30-36

Abstract

A statistical analysis of the static speckle produced by illuminatinga disordered aerogel sample by a nominally coherent X-ray beam at wiggler beamline X25 at the National Synckrotron Light Source is reported. The results of the analysis show that the coherence delivered to theX25 hutch is within 35% of what is expected. The rate of coherent photons is approximately two times smaller than expected on the basis of the X25 wiggler source brilliance.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 20/09/20 alle ore 07:07:37