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Titolo:
POLING BEHAVIOR AT THE GRAIN-BOUNDARIES OF PZT THIN-FILMS INVESTIGATED BY MEANS OF ELECTRIC FORCE MICROSCOPY
Autore:
FRANKE K; HUELZ H; WEIHNACHT M; SEIFERT S;
Indirizzi:
INST FESTKORPER & WERKSTOFFORSCH DRESDEN EV D-01171 DRESDEN GERMANY FRAUNHOFER INST SILICATFORSCH D-97082 WURZBURG GERMANY
Titolo Testata:
Journal of the Korean Physical Society
, volume: 32, anno: 1998,
parte:, 3 supplemento:, S
pagine: 1143 - 1145
SICI:
0374-4884(1998)32:<1143:PBATGO>2.0.ZU;2-N
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
10
Recensione:
Indirizzi per estratti:
Citazione:
K. Franke et al., "POLING BEHAVIOR AT THE GRAIN-BOUNDARIES OF PZT THIN-FILMS INVESTIGATED BY MEANS OF ELECTRIC FORCE MICROSCOPY", Journal of the Korean Physical Society, 32, 1998, pp. 1143-1145

Abstract

The Electric Force Microscope is used to investigate the poling behaviour of ferroelectric PZT thin films. Successively measured polarization distributions were compared with high resolution The poling characteristics are investigated separately at the grain boundaries and inside the grain volumes. For films prepared by sol-gel processing, it is shown that the switchable polarization is decreased at the grain boundaries with respect to the grain volumes. The coercive field is clearly increased at the grain boundaries.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/12/20 alle ore 09:34:54