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Titolo:
STM AND AFM INVESTIGATIONS OF SURFACE-STRUCTURES FOLLOWING SWIFT HEAVY-ION IRRADIATION
Autore:
HAVANCSAK K; BIRO LP; GYULAI J; ILLES Z;
Indirizzi:
LORAND EOTVOS UNIV,INST SOLID STATE PHYS,MUZEUM KRT 6-8 H-1088 BUDAPEST HUNGARY KFKI RES INST MAT SCI H-1525 BUDAPEST HUNGARY
Titolo Testata:
Journal of nuclear materials
, volume: 251, anno: 1997,
pagine: 139 - 144
SICI:
0022-3115(1997)251:<139:SAAIOS>2.0.ZU;2-C
Fonte:
ISI
Lingua:
ENG
Soggetto:
GRAPHITE SURFACE; FORCE-MICROSCOPY; MICA;
Tipo documento:
Article
Natura:
Periodico
Citazioni:
15
Recensione:
Indirizzi per estratti:
Citazione:
K. Havancsak et al., "STM AND AFM INVESTIGATIONS OF SURFACE-STRUCTURES FOLLOWING SWIFT HEAVY-ION IRRADIATION", Journal of nuclear materials, 251, 1997, pp. 139-144

Abstract

Samples of highly oriented pyrolitic graphite, muscovite mica and (100) oriented silicon were irradiated with 209 MeV Kr ions. The irradiations were performed in a perpendicular direction to the sample surface. The irradiation fluence used was 10(12) ions/cm(2). Scanning tunnelling microscope (STM) and atomic force microscope (AFM) observations were accomplished without any further sample preparation. Experimental observations are compared to computer simulations (TRIM code) and primary knock-on atomic spectrum calculations (LET code). Surface features observed on different materials are characterised and compared to eachother. Distinction can be made between surface features attributed tonuclear stopping effects and defects owing to electronic stopping mechanisms. (C) 1997 Elsevier Science B.V.

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Documento generato il 06/07/20 alle ore 08:36:53