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Titolo:
X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS
Autore:
DRESSLER L; GOETZ K; KRAUSSLICH J;
Indirizzi:
UNIV JENA,INST OPT & QUANTENELEKT,MAX WIEN PL 1 D-07743 JENA GERMANY
Titolo Testata:
Physica status solidi. b, Basic research
fascicolo: 2, volume: 200, anno: 1997,
pagine: 377 - 383
SICI:
0370-1972(1997)200:2<377:XDD(IS>2.0.ZU;2-X
Fonte:
ISI
Lingua:
ENG
Soggetto:
QUANTITATIVE-DETERMINATION; FORBIDDEN REFLECTIONS; 3-BEAM DIFFRACTION; PHASES;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
26
Recensione:
Indirizzi per estratti:
Citazione:
L. Dressler et al., "X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS", Physica status solidi. b, Basic research, 200(2), 1997, pp. 377-383

Abstract

Weak reflections are useful for the refinement of crystal structures because they are sensitive to certain structural changes and do not require extinction corrections. Double reflections due to umweganregung should be suppressed since they give extraneous signals. A theoreticaland experimental determination of double reflections (four-beam case)is required to find angular positions where they do not occur.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 30/09/20 alle ore 09:20:06