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Titolo:
LATERALLY RESOLVED MEASUREMENTS OF POLYCRYSTALLINE CESIUM IODIDE SURFACES
Autore:
RUDOLF P; MARCHAL F; SPORKEN R; CAUDANO R; DELLORTO T; ALMEIDA J; BRAEM A; PIUZ F; SGOBBA S; PAIC G; NAPPI E; VALENTINI A; SARTORI P; COLUZZA C;
Indirizzi:
IST NAZL FIS NUCL,SEZ ROMA 1,DIPARTIMENTO FIS G MARCONI,PLE A MORO 2 I-00185 ROME ITALY IST NAZL FIS NUCL,SEZ ROMA 1,DIPARTIMENTO FIS G MARCONI I-00185 ROME ITALY FAC UNIV NOTRE DAME PAIX,LISE B-5000 NAMUR BELGIUM CTR COMPETENZA MICROELETTRON CONSORZIO ROMA I-00173 ROME ITALY ECOLE POLYTECH FED LAUSANNE,INST PHYS APPL CH-1015 LAUSANNE SWITZERLAND CERN,DIV PPE CH-1121 GENEVA 23 SWITZERLAND ECOLE MINES,SUBATECH F-44070 NANTES 03 FRANCE IST NAZL FIS NUCL,SEZ BARI I-70126 BARI ITALY IST NAZL FIS NUCL,SEZ PADOVA,DIPARTIMENTO FIS G GALILEI I-35121 PADUAITALY
Titolo Testata:
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
fascicolo: 1-2, volume: 387, anno: 1997,
pagine: 163 - 170
SICI:
0168-9002(1997)387:1-2<163:LRMOPC>2.0.ZU;2-#
Fonte:
ISI
Lingua:
ENG
Soggetto:
SECONDARY-ELECTRON EMISSION; RAY PHOTO-CATHODES; WAVELENGTH BAND 1-300; QUANTUM YIELD; LARGE-AREA; X-RAYS; CSI; PHOTOCATHODES; SPECTROSCOPY; INSULATORS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
34
Recensione:
Indirizzi per estratti:
Citazione:
P. Rudolf et al., "LATERALLY RESOLVED MEASUREMENTS OF POLYCRYSTALLINE CESIUM IODIDE SURFACES", Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 387(1-2), 1997, pp. 163-170

Abstract

The aim of this work was to establish the correlation between the local chemical composition and morphology of polycrystalline cesium iodide (CsI) and its local quantum efficiency. We used a laterally resolvedElectron Spectroscopy for Chemical Analysis (ESCA-300) apparatus and a Scanning Auger Microprobe (SAM) to investigate the lateral inhomogeneity of the CsI surface stoichiometry. The local quantum efficiency (QE) was determined by measuring the secondary electron emission in Photoemission Electron Microscopy both with a non-monochromatized deuterium lamp and with tunable X-ray synchrotron radiation as the excitation source. CsI films on different substrates were studied. We found that the local QE depends strongly on the morphology, on the local stoichiometry and on carbon contamination. The results allow for an optimisation of the quantum efficiency of large area photocathodes.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 04/12/20 alle ore 19:21:48