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Titolo:
X-ray photoelectron spectroscopy characterization of stain-etched luminescent porous silicon films
Autore:
Zanoni, R; Righini, G; Mattogno, G; Schirone, L; Sotgiu, G; Rallo, F;
Indirizzi:
Univ Rome La Sapienza, Dipartimento Chim, I-00185 Rome, Italy Univ Rome LaSapienza Rome Italy I-00185 mento Chim, I-00185 Rome, Italy CNR, Area Ric Roma, I-00016 Monterotondo, Italy CNR Monterotondo Italy I-00016 rea Ric Roma, I-00016 Monterotondo, Italy CNR, ICMAT, I-00016 Monterotondo, Italy CNR Monterotondo Italy I-00016CNR, ICMAT, I-00016 Monterotondo, Italy Univ Roma Tre, Dipartimento Ingn Elettron, I-00146 Rome, Italy Univ Roma Tre Rome Italy I-00146 ento Ingn Elettron, I-00146 Rome, Italy
Titolo Testata:
JOURNAL OF LUMINESCENCE
fascicolo: 1-4, volume: 80, anno: 1998,
pagine: 159 - 162
SICI:
0022-2313(199812)80:1-4<159:XPSCOS>2.0.ZU;2-D
Fonte:
ISI
Lingua:
ENG
Soggetto:
SOLAR-CELLS; PHOTOLUMINESCENCE; XPS; SI;
Keywords:
silicon; porous; stain etch; photoluminescence; XPS; photoelectron spectroscopy;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
15
Recensione:
Indirizzi per estratti:
Indirizzo: Zanoni, R Univ5Rome La Sapienza, Dipartimento Chim, P A Moro 5,Box 34,Roma62, I-0018 Univ Rome La Sapienza P A Moro 5,Box 34,Roma 62 Rome Italy I-00185
Citazione:
R. Zanoni et al., "X-ray photoelectron spectroscopy characterization of stain-etched luminescent porous silicon films", J LUMINESC, 80(1-4), 1998, pp. 159-162

Abstract

The surface and in-depth chemical nature of the photoluminescent stained Si layer obtained with a novel procedure based on HF/HNO3 is presented. Oxide-free porous Si surfaces result from controlled preparation, storing and handling of samples, as revealed by parallel X-ray photoelectron spectroscopy and X-ray-induced Anger electron spectroscopy measurements, coupled with Ar+ ion sputtering. The present findings support the model for the porous layer of oxidized samples of Si grains embedded in a silica gel matrix. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

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Documento generato il 04/12/20 alle ore 00:51:00