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Titolo:
MINIMUM IN THE VOLTAGE-DEPENDENCE OF THE RESISTANCE OF THIN YBA2CU3O7-X MICROBRIDGES
Autore:
DOSTANKO AP; POGREBNYAKOV AV; SHENG YK; LEVINSEN MT; FRELTOFT T;
Indirizzi:
BELORUSSIAN INFORMAT & RADIOELECT STATE UNIV MINSK BYELARUS NIELS BOHR LAB COPENHAGEN DENMARK NKT CORP,DEPT RES COPENHAGEN DENMARK
Titolo Testata:
Doklady Akademii nauk BSSR
fascicolo: 6, volume: 40, anno: 1996,
pagine: 44 - 48
SICI:
0002-354X(1996)40:6<44:MITVOT>2.0.ZU;2-T
Fonte:
ISI
Lingua:
RUS
Soggetto:
ANDREEV REFLECTION; WEAK LINKS; CONDUCTANCE; MICROJUNCTIONS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
A.P. Dostanko et al., "MINIMUM IN THE VOLTAGE-DEPENDENCE OF THE RESISTANCE OF THIN YBA2CU3O7-X MICROBRIDGES", Doklady Akademii nauk BSSR, 40(6), 1996, pp. 44-48

Abstract

A differential resistance minimum at zero bias voltage was observed in the characteristics of YBa2Cu3O7-x thin film microbridges of 10 mu min length (L) and 1 mu m in width (W), or L = 3 mu m and W = 2 mu m which had no supercurrent at the temperatures above 4,2K. Possible causes of the minimum appearance are discussed.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 24/09/20 alle ore 20:40:29