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Titolo:
High-resolution x-ray spectromicroscopy with the Tokyo electron beam ion
Autore:
Nakamura, N; Faenov, AY; Pikuz, TA; Nojikawa, E; Shiraishi, H; Currell, FJ; Ohtani, S;
Indirizzi:
JapanJapan& Technol Corp, ICORP, Cold Trapped Ions Project, Tokyo 1820024,Japan Sci & Technol Corp Tokyo Japan 1820024 ons Project, Tokyo 1820024, Univ Electrocommun, Inst Laser Sci, Tokyo 1828585, Japan Univ Electrocommun Tokyo Japan 1828585 t Laser Sci, Tokyo 1828585, Japan
Titolo Testata:
REVIEW OF SCIENTIFIC INSTRUMENTS
fascicolo: 3, volume: 70, anno: 1999,
pagine: 1658 - 1664
SICI:
0034-6748(199903)70:3<1658:HXSWTT>2.0.ZU;2-L
Fonte:
ISI
Lingua:
ENG
Soggetto:
CHARGED IONS; TRAP; SPECTROSCOPY; ENERGY; PERFORMANCE; TRANSITION; PLASMA;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
26
Recensione:
Indirizzi per estratti:
Indirizzo: Nakamura, N JapanJapan& Technol Corp, ICORP, Cold Trapped Ions Project, Tokyo 1820024, Japan Sci & Technol Corp Tokyo Japan 1820024 Tokyo 1820024,
Citazione:
N. Nakamura et al., "High-resolution x-ray spectromicroscopy with the Tokyo electron beam ion", REV SCI INS, 70(3), 1999, pp. 1658-1664

Abstract

A high-resolution x-ray spectrometer with a spherically bent quartz crystal and an x-ray sensitive charge coupled device (CCD) have been applied to the observation of highly charged ions produced and trapped in the Tokyo electron beam ion trap (EBIT). The spectrometer made it possible to measure the spatial distribution and wavelength of the radiation at the same time. A simple, but lower energy resolution method was also used, by taking advantage of the intrinsic energy resolution of the CCD. The possibility to apply such techniques to diagnostics of an EBIT is discussed. (C) 1999 American Institute of Physics. [S0034-6748(99)00103-3].

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 19/01/20 alle ore 12:26:51