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Titolo:
ANALYTICAL CHARACTERIZATION OF SURFACES BY SCANNING FORCE MICROSCOPY
Autore:
FRIEDBACHER G; RESCH R; SCHMITZ I; KOLLENSPERGER G; SCHREINER M; GRASSERBAUER M;
Indirizzi:
VIENNA TECH UNIV,INST ANALYT CHEM,GETREIDEMARKT 9-151 A-1060 VIENNA AUSTRIA ACAD FINE ARTS,INST CHEM A-1010 VIENNA AUSTRIA
Titolo Testata:
Annali di chimica
fascicolo: 3-4, volume: 87, anno: 1997,
pagine: 145 - 163
SICI:
0003-4592(1997)87:3-4<145:ACOSBS>2.0.ZU;2-K
Fonte:
ISI
Lingua:
ENG
Soggetto:
ORIENTED PYROLYTIC-GRAPHITE; IONIC LAYER ADSORPTION; ZN1-XCDXS THIN-FILMS; TUNNELING-MICROSCOPY; TAPPING-MODE; ULTRAFINE PARTICLES; STM; ZNS; GROWTH; GOLD;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
54
Recensione:
Indirizzi per estratti:
Citazione:
G. Friedbacher et al., "ANALYTICAL CHARACTERIZATION OF SURFACES BY SCANNING FORCE MICROSCOPY", Annali di chimica, 87(3-4), 1997, pp. 145-163

Abstract

From the analytical chemist's point of view the power of Atomic ForceMicroscopy (AFM) is based on a unique combination of figures of meritwhich allow to obtain information not accessible by other analytical techniques. In this presentation background, principles and analyticalpotential of AFM will be briefly reviewed and then documented by a number of selected examples and applications including characterization of aerosol particles, in-situ studies of thin film deposition and in-situ investigation of glass corrosion.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 07/07/20 alle ore 05:28:44