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Titolo:
Case study: an investigation into the cause of 'error rate drift'
Autore:
Chandler, S; Tucker, B; Turner, P; Heard, P;
Indirizzi:
Hewlettndackard Co, Comp Peripherals Bristol, Bristol BS12 6QZ, Avon, Engla Hewlett Packard Co Bristol Avon England BS12 6QZ ol BS12 6QZ, Avon, Engla Univ Bristol, Interface Anal Ctr, Bristol BS2 8BS, Avon, England Univ Bristol Bristol Avon England BS2 8BS Bristol BS2 8BS, Avon, England
Titolo Testata:
TRIBOLOGY INTERNATIONAL
fascicolo: 8, volume: 31, anno: 1998,
pagine: 443 - 448
SICI:
0301-679X(199808)31:8<443:CSAIIT>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Keywords:
tape; head; contamination;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
Citazioni:
6
Recensione:
Indirizzi per estratti:
Indirizzo: Chandler, S HewlettAvon,ard Co, Comp Peripherals Bristol, Filton Rd, Bristol BS12 6QZ, Hewlett Packard Co Filton Rd Bristol Avon England BS12 6QZ QZ,
Citazione:
S. Chandler et al., "Case study: an investigation into the cause of 'error rate drift'", TRIBOL INT, 31(8), 1998, pp. 443-448

Abstract

During product development some Hewlett-Packard DDS tape drives experienced a gradual increase in their uncorrected error rate when running a particular operating test at low humidity. This was known as 'error rate drift'. Acombination of system-level testing, signal processing, and atomic force microscopy showed that the degradation was caused by contamination on the surface of the heads. The 'stain' thickness increased each time tape was reused, resulting in progressive attenuation of the readback signal amplitude. Using time-of-flight secondary ion mass spectroscopy the contaminant was identified as inorganic Fe, Si and Al, transferred from the media. (C) 1999 Elsevier Science Ltd. All rights reserved.

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Documento generato il 02/12/20 alle ore 05:24:22