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Titolo: Fluxflow instability and its anisotropy in Bi2Sr2CaCu2O8+delta superconducting films
Autore: Xiao, ZL; Vossde Haan, P; Jakob, G; Kluge, T; Haibach, P; Adrian, H; Andrei, EY;
 Indirizzi:
 Univ Mainz, Inst Phys, D55099 Mainz, Germany Univ Mainz Mainz Germany D55099 ainz, Inst Phys, D55099 Mainz, Germany Rutgers State Univ, Dept Phys & Astron, Piscataway, NJ 08855 USA Rutgers State Univ Piscataway NJ USA 08855 tron, Piscataway, NJ 08855 USA Univ Mainz, Inst Phys, D55099 Mainz, Germany Univ Mainz Mainz Germany D55099 ainz, Inst Phys, D55099 Mainz, Germany
 Titolo Testata:
 PHYSICAL REVIEW BCONDENSED MATTER
fascicolo: 2,
volume: 59,
anno: 1999,
pagine: 1481  1490
 SICI:
 01631829(19990101)59:2<1481:FIAIAI>2.0.ZU;23
 Fonte:
 ISI
 Lingua:
 ENG
 Soggetto:
 HIGHCURRENT DENSITIES; THINFILMS; ELECTRONIC INSTABILITY; VORTEX DYNAMICS; CUPRATE SUPERCONDUCTORS; ANGULARDEPENDENCE; YBA2CU3O7DELTA; BEHAVIOR; DISSIPATION; LATTICES;
 Tipo documento:
 Article
 Natura:
 Periodico
 Settore Disciplinare:
 Physical, Chemical & Earth Sciences
 discip_EC
 Citazioni:
 44
 Recensione:
 Indirizzi per estratti:
 Indirizzo: Xiao, ZL Univ Mainz, Inst Phys, Staudinger Weg 7, D55099 Mainz, Germany Univ Mainz Staudinger Weg 7 Mainz Germany D55099 Mainz, Germany



 Citazione:
 Z.L. Xiao et al., "Fluxflow instability and its anisotropy in Bi2Sr2CaCu2O8+delta superconducting films", PHYS REV B, 59(2), 1999, pp. 14811490
Abstract
We report measurements on voltage instability at high fluxflow velocitiesin Bi2Sr2CaCu2O8 + delta superconducting films. Currentvoltage (I  V) characteristics have been measured as a function of temperature, magnetic field, and angle between the field and the c axis of the sample. Voltage jumpswere observed in IV characteristics taken in all magneticheld directionsand in extended temperature and field ranges. An analysis of the experimental data, based on a theory for viscous fluxflow instability with a finiteheatremoval rate from the sample, yielded the inelastic scattering rate and the diffusion length of quasiparticles. Reasonable values of the heattransfer coefficient from film to bath have been obtained. This theory can also successfully explain the observed scaling behavior I*(T,H) = I*(H)(1  T/Tco)(3/2) with I*(H) proportional to 1/(1 + H/H0)(alpha), where Tco, H0, and alpha are fitting parameters, determined by the temperature and magneticfield dependence of the critical current I* at which the voltage jumpsoccur. A twodimensional scaling for the angular dependence of the critical current I* and the critical voltage V* associated with the voltage jump has been found and interpreted with a model based on the twodimensional behavior of this system. [S01631829(99)109019].
ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 31/03/20 alle ore 19:40:24