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Titolo:
Flux-flow instability and its anisotropy in Bi2Sr2CaCu2O8+delta superconducting films
Autore:
Xiao, ZL; Voss-de Haan, P; Jakob, G; Kluge, T; Haibach, P; Adrian, H; Andrei, EY;
Indirizzi:
Univ Mainz, Inst Phys, D-55099 Mainz, Germany Univ Mainz Mainz Germany D-55099 ainz, Inst Phys, D-55099 Mainz, Germany Rutgers State Univ, Dept Phys & Astron, Piscataway, NJ 08855 USA Rutgers State Univ Piscataway NJ USA 08855 tron, Piscataway, NJ 08855 USA Univ Mainz, Inst Phys, D-55099 Mainz, Germany Univ Mainz Mainz Germany D-55099 ainz, Inst Phys, D-55099 Mainz, Germany
Titolo Testata:
PHYSICAL REVIEW B-CONDENSED MATTER
fascicolo: 2, volume: 59, anno: 1999,
pagine: 1481 - 1490
SICI:
0163-1829(19990101)59:2<1481:FIAIAI>2.0.ZU;2-3
Fonte:
ISI
Lingua:
ENG
Soggetto:
HIGH-CURRENT DENSITIES; THIN-FILMS; ELECTRONIC INSTABILITY; VORTEX DYNAMICS; CUPRATE SUPERCONDUCTORS; ANGULAR-DEPENDENCE; YBA2CU3O7-DELTA; BEHAVIOR; DISSIPATION; LATTICES;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
44
Recensione:
Indirizzi per estratti:
Indirizzo: Xiao, ZL Univ Mainz, Inst Phys, Staudinger Weg 7, D-55099 Mainz, Germany Univ Mainz Staudinger Weg 7 Mainz Germany D-55099 Mainz, Germany
Citazione:
Z.L. Xiao et al., "Flux-flow instability and its anisotropy in Bi2Sr2CaCu2O8+delta superconducting films", PHYS REV B, 59(2), 1999, pp. 1481-1490

Abstract

We report measurements on voltage instability at high flux-flow velocitiesin Bi2Sr2CaCu2O8 + delta superconducting films. Current-voltage (I - V) characteristics have been measured as a function of temperature, magnetic field, and angle between the field and the c axis of the sample. Voltage jumpswere observed in I-V characteristics taken in all magnetic-held directionsand in extended temperature and field ranges. An analysis of the experimental data, based on a theory for viscous flux-flow instability with a finiteheat-removal rate from the sample, yielded the inelastic scattering rate and the diffusion length of quasiparticles. Reasonable values of the heat-transfer coefficient from film to bath have been obtained. This theory can also successfully explain the observed scaling behavior I*(T,H) = I*(H)(1 - T/T-co)(3/2) with I*(H) proportional to 1/(1 + H/H-0)(alpha), where T-co, H-0, and alpha are fitting parameters, determined by the temperature and magnetic-field dependence of the critical current I* at which the voltage jumpsoccur. A two-dimensional scaling for the angular dependence of the critical current I* and the critical voltage V* associated with the voltage jump has been found and interpreted with a model based on the two-dimensional behavior of this system. [S0163-1829(99)10901-9].

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Documento generato il 31/03/20 alle ore 19:40:24