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Titolo:
Application of Dynamical Optical Reflection Thermography (DORT) for detecting of dark current inhomogeneity in semiconductor devices
Autore:
Litvinenko, SV; Kilchitskaya, SS; Skryshevsky, VA; Strikha, VI; Laugier, A;
Indirizzi:
Kiev Taras Shevchenko Univ, Radiophys Dept, UA-252017 Kiev, Ukraine Kiev Taras Shevchenko Univ Kiev Ukraine UA-252017 A-252017 Kiev, Ukraine Inst Natl Sci Appl, Phys Mat Lab, F-69621 Villeurbanne, France Inst Natl Sci Appl Villeurbanne France F-69621 9621 Villeurbanne, France
Titolo Testata:
APPLIED SURFACE SCIENCE
fascicolo: 1-4, volume: 137, anno: 1999,
pagine: 45 - 49
SICI:
0169-4332(199901)137:1-4<45:AODORT>2.0.ZU;2-0
Fonte:
ISI
Lingua:
ENG
Keywords:
Dynamical Optical Reflection Thermography; dark current inhomogeneities; semiconductor devices;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
9
Recensione:
Indirizzi per estratti:
Indirizzo: Litvinenko, SV KievKiev,s Shevchenko Univ, Radiophys Dept, Volodimirska Str 64, UA-252017 Kiev Taras Shevchenko Univ Volodimirska Str 64 Kiev Ukraine UA-252017
Citazione:
S.V. Litvinenko et al., "Application of Dynamical Optical Reflection Thermography (DORT) for detecting of dark current inhomogeneity in semiconductor devices", APPL SURF S, 137(1-4), 1999, pp. 45-49

Abstract

A novel technique named Dynamical Optical Reflection Thermography (DORT) able to detect the dark current inhomogeneities in semiconductor devices such as solar cells, have been proposed. It is based on the principles of dynamical heating of defect dots by the pulse dark current and registration of the temperature alteration by the measurement of the external reflection from the semiconductor surface. Lock-in technique and statistical evaluation of the modulated reflectance data were used to improve the method sensitivity. A temperature waves process is proved to be a reason of reflectance modulation under impulse current applied to the tested solar cells. Spatial distributions for the DORT signal were obtained. (C) 1999 Elsevier Science B.V. All rights reserved.

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Documento generato il 28/11/20 alle ore 03:10:37