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Titolo:
SUBSTRATE EFFECTS AND CHEMICAL-STATE PLOTS FOR THE XPS ANALYSIS OF SUPPORTED TIO2 CATALYSTS
Autore:
JIMENEZ VM; LASSALETTA G; FERNANDEZ A; ESPINOS JP; GONZALEZELIPE AR;
Indirizzi:
UNIV SEVILLA,CSIC,INST CIENCIA MAT SEVILLA,POB 1115 E-41080 SEVILLE SPAIN UNIV SEVILLA,CSIC,INST CIENCIA MAT SEVILLA E-41080 SEVILLE SPAIN DEPT QUIM INORGAN SEVILLE 41080 SPAIN
Titolo Testata:
Surface and interface analysis
fascicolo: 4, volume: 25, anno: 1997,
pagine: 292 - 294
SICI:
0142-2421(1997)25:4<292:SEACPF>2.0.ZU;2-4
Fonte:
ISI
Lingua:
ENG
Soggetto:
CLUSTERS; SILICA; SIO2; PARTICLES; ALUMINA; SIZE;
Keywords:
XPS; AUGER PARAMETER; TIO2; CATALYST; CHEMICAL STATE PLOT;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
18
Recensione:
Indirizzi per estratti:
Citazione:
V.M. Jimenez et al., "SUBSTRATE EFFECTS AND CHEMICAL-STATE PLOTS FOR THE XPS ANALYSIS OF SUPPORTED TIO2 CATALYSTS", Surface and interface analysis, 25(4), 1997, pp. 292-294

Abstract

The analysis by XPS of TiO2 deposited on different substrates (SiO2, MgO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation ofthese shifts is possible with a chemical state plot. The implicationsof the existence of such shifts for the characterization of catalystsare discussed. (C) 1997 by John Wiley & Sons, Ltd.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 27/11/20 alle ore 22:16:23