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Titolo:
A METHOD TO SUBTRACT THE TRANSMISSION AND DISPERSION ANALYZER EFFECT FROM HIGH-INTENSITY, LOW-RESOLUTION XPS SPECTRA
Autore:
BATTISTONI C; MATTOGNO G; RIGHINI G;
Indirizzi:
IST CHIM MAT,CNR,POB 10 I-00016 ROME ITALY
Titolo Testata:
Surface and interface analysis
fascicolo: 8, volume: 20, anno: 1993,
pagine: 655 - 658
SICI:
0142-2421(1993)20:8<655:AMTSTT>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
ELECTRON SPECTROMETERS; AES; DECONVOLUTION; SPECTROSCOPY; CALIBRATION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
C. Battistoni et al., "A METHOD TO SUBTRACT THE TRANSMISSION AND DISPERSION ANALYZER EFFECT FROM HIGH-INTENSITY, LOW-RESOLUTION XPS SPECTRA", Surface and interface analysis, 20(8), 1993, pp. 655-658

Abstract

The quality of XPS and AES data in terms of both peak position and intensity is critically dependent on the experimental conditions. It is known that when using the electron energy analyser-detector system under different experimental conditions, the relative intensity peak ratios change remarkably. The knowledge of the energy dependence of the spectrometer's intensity response funCtion is important for quantitativeanalyses. In order to handle experimental conditions (e.g. small-areaXPS) a methodological procedure to estimate the effect of individual parameters is proposed. According to this procedure the spectra are manipulated using a modified deconvolution routine that contemporaneously takes into account the relative transmission function and analyser broadening function.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 29/11/20 alle ore 10:25:32