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Titolo:
LASER-SURFACE PHOTOVOLTAGE SPECTROSCOPY - A NEW TOOL FOR THE DETERMINATION OF SURFACE-STATE DISTRIBUTIONS
Autore:
KRONIK L; BURSTEIN L; SHAPIRA Y; ORON M;
Indirizzi:
TEL AVIV UNIV,FAC ENGN,DEPT ELECT ENGN PHYS ELECTR IL-69978 TEL AVIV ISRAEL SOREQ NRC IL-70600 YAVNE ISRAEL
Titolo Testata:
Applied physics letters
fascicolo: 1, volume: 63, anno: 1993,
pagine: 60 - 62
SICI:
0003-6951(1993)63:1<60:LPS-AN>2.0.ZU;2-0
Fonte:
ISI
Lingua:
ENG
Soggetto:
METAL INTERFACES; RECOMBINATION; GAAS; CDS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
16
Recensione:
Indirizzi per estratti:
Citazione:
L. Kronik et al., "LASER-SURFACE PHOTOVOLTAGE SPECTROSCOPY - A NEW TOOL FOR THE DETERMINATION OF SURFACE-STATE DISTRIBUTIONS", Applied physics letters, 63(1), 1993, pp. 60-62

Abstract

A new experimental technique, which utilizes a tunable laser as the illumination source for surface photovoltage spectroscopy measurements,is presented. The data obtained by this technique make it possible todetermine the distribution function of gap states observed at semiconductor interfaces. An outline of the approach together with experimental results obtained using a Ti:sapphire laser on InAlAs and CdTe crystals is given.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/09/20 alle ore 09:14:55