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Titolo:
WIDE-BAND FREQUENCY-RESPONSE MEASUREMENTS OF PHOTODETECTORS USING LOW-LEVEL PHOTOCURRENT NOISE DETECTION
Autore:
XIE FZ; KUHL D; BOTTCHER EH; REN SY; BIMBERG D;
Indirizzi:
TECH UNIV BERLIN,INST FESTKORPERPHYS 1,HARDENBERGSTR 36 W-1000 BERLIN12 GERMANY
Titolo Testata:
Journal of applied physics
fascicolo: 12, volume: 73, anno: 1993,
pagine: 8641 - 8646
SICI:
0021-8979(1993)73:12<8641:WFMOPU>2.0.ZU;2-X
Fonte:
ISI
Lingua:
ENG
Soggetto:
OPTICAL HETERODYNE; PHOTODIODES;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
24
Recensione:
Indirizzi per estratti:
Citazione:
F.Z. Xie et al., "WIDE-BAND FREQUENCY-RESPONSE MEASUREMENTS OF PHOTODETECTORS USING LOW-LEVEL PHOTOCURRENT NOISE DETECTION", Journal of applied physics, 73(12), 1993, pp. 8641-8646

Abstract

We report a novel measurement technique for the wide-band determination of the frequency response of photodetectors. It is based upon the accurate measurement of the photocurrent noise spectra under illumination with a light-emitting diode. The high sensitivity of -200 dBm/Hz within a frequency regime from 10 MHz to 1.6 GHz renders it particularlyattractive for investigating the response behavior at low optical input levels and for characterizing frequency-dependent gain phenomena. The practical potential of the method is illustrated by applying it to various types of InGaAs-based photodetectors (p-i-n and avalanche photodiodes and metal-semiconductor-metal photodetectors).

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Documento generato il 03/07/20 alle ore 22:58:58