Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
XPS ANALYSIS OF SOL-GEL PROCESSED DOPED AND UNDOPED TIO2 FILMS FOR SENSORS
Autore:
ZANONI R; RIGHINI G; MONTENERO A; GNAPPI G; MONTEPERELLI G; TRAVERSA E; GUSMANO G;
Indirizzi:
UNIV ROMA LA SAPIENZA,DIPARTIMENTO CHIM,PL A MORO 5 I-00185 ROME ITALY CNR,SERV ESCA I-0016 ROME ITALY UNIV PARMA,IST STRUTTURIST CHIM I-43100 PARMA ITALY UNIV ROMA TOR VERGATA,DIPARTIMENTO SCI & TECNOL CHIM I-00133 ROME ITALY
Titolo Testata:
Surface and interface analysis
fascicolo: 1-12, volume: 22, anno: 1994,
pagine: 376 - 379
SICI:
0142-2421(1994)22:1-12<376:XAOSPD>2.0.ZU;2-4
Fonte:
ISI
Lingua:
ENG
Soggetto:
X-RAY PHOTOELECTRON; SPECTROSCOPY; TIO2(110); SURFACES;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
21
Recensione:
Indirizzi per estratti:
Citazione:
R. Zanoni et al., "XPS ANALYSIS OF SOL-GEL PROCESSED DOPED AND UNDOPED TIO2 FILMS FOR SENSORS", Surface and interface analysis, 22(1-12), 1994, pp. 376-379

Abstract

We have used x-ray photoelectron spectroscopy (XPS) to probe the actual surface composition of alkali-doped and undoped TiO2 films preparedby the sol-gel technique. The role of thermal pretreatments, conducted at various temperatures, and the effect of doping with Na are discussed. XPS results are compared with the electrical response of prototype devices having TiO2 films as the active element, with the help of electrochemical impedance spectroscopy (EIS) measurements.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 27/09/20 alle ore 19:32:21