Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
INTERNAL ANALYZER INELASTIC-SCATTERING EFFECTS IN XPS QUANTITATIVE-ANALYSIS
Autore:
BATTISTONI C; MATTOGNO G; RIGHINI G;
Indirizzi:
CNR,IST CHIM MAT,POB 10 I-00016 ROME ITALY
Titolo Testata:
Surface and interface analysis
fascicolo: 1-12, volume: 22, anno: 1994,
pagine: 98 - 102
SICI:
0142-2421(1994)22:1-12<98:IAIEIX>2.0.ZU;2-7
Fonte:
ISI
Lingua:
ENG
Soggetto:
SPECTROMETER TRANSMISSION FUNCTION; ELECTRON SPECTROMETERS; CALIBRATION; INTENSITY; SPECTRA; AES;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
9
Recensione:
Indirizzi per estratti:
Citazione:
C. Battistoni et al., "INTERNAL ANALYZER INELASTIC-SCATTERING EFFECTS IN XPS QUANTITATIVE-ANALYSIS", Surface and interface analysis, 22(1-12), 1994, pp. 98-102

Abstract

The shape of spectrum in XPS depends on processes in the sample and on the properties of measurements systems. Noise, electron energy analyser resolution, electron inelastic scattering in the sample and analyser, and non-monochromatic radiation produce a quality reduction of spectrum for quantitative analysis. The undesired scattering of electronson the outer hemisphere of the analyser or into the lens system leadsto spectral background shape distortion and difficulties in the analysis of intensity transmission and resolution functions. A new mathematic procedure, based on deconvolution method, for evaluation and removing instrumental artefact is proposed.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 04/12/20 alle ore 01:39:09