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Titolo:
THE MEASUREMENT OF ENHANCED PIXE YIELDS WITH HE-3(2+) IONS
Autore:
PEISACH M; PINEDA CA; PILLAY AE;
Indirizzi:
NATL ACCELERATOR CTR,VANDEGRAAFF GRP,BOX 72 FAURE 7131 SOUTH AFRICA UNIV WITWATERSRAND,CTR APPL CHEM,DEPT CHEM WITWATERSRAND 2050 SOUTH AFRICA
Titolo Testata:
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
fascicolo: 1-4, volume: 85, anno: 1994,
pagine: 100 - 103
SICI:
0168-583X(1994)85:1-4<100:TMOEPY>2.0.ZU;2-5
Fonte:
ISI
Lingua:
ENG
Soggetto:
SPECTROMETRY;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
5
Recensione:
Indirizzi per estratti:
Citazione:
M. Peisach et al., "THE MEASUREMENT OF ENHANCED PIXE YIELDS WITH HE-3(2+) IONS", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 100-103

Abstract

The cause of the high enhancement factor in a PIXE study of metal fluorides was investigated with singly and doubly charged He-3 ions. A comparison of the X-ray yields and enhancement factors showed that gammarays from the de-excitation of coulomb excited F-19 ions were not responsible for this effect. Charge buildup and subsequent discharge produced energetic electrons which generated the large yields of X-rays. The energy distribution of these electrons ranged from a low concentration at energies around 4 keV, peaked at an energy around 10 keV and extended to beyond 30 keV. The importance for PIXE analysis was noted.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 10/07/20 alle ore 03:15:39