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Titolo:
OBSERVATION OF FRACTAL PATTERNS IN C-60 POLYMER THIN-FILMS
Autore:
GAO HJ; XUE ZQ; WU QD; PANG S;
Indirizzi:
BEIJING UNIV,DEPT RADIO ELECTR BEIJING 100871 PEOPLES R CHINA ACAD SINICA,BEIJING LAB VACUUM PHYS BEIJING 100080 PEOPLES R CHINA
Titolo Testata:
Journal of materials research
fascicolo: 9, volume: 9, anno: 1994,
pagine: 2216 - 2218
SICI:
0884-2914(1994)9:9<2216:OOFPIC>2.0.ZU;2-5
Fonte:
ISI
Lingua:
ENG
Soggetto:
DIFFUSION-LIMITED AGGREGATION; ION IRRADIATION; CRYSTAL-GROWTH; C-60; TRANSITIONS;
Tipo documento:
Note
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
22
Recensione:
Indirizzi per estratti:
Citazione:
H.J. Gao et al., "OBSERVATION OF FRACTAL PATTERNS IN C-60 POLYMER THIN-FILMS", Journal of materials research, 9(9), 1994, pp. 2216-2218

Abstract

We report the observation of fractal patterns in C60-tetracyanoquinodimethane thin films. The fractal patterns and their microscopic features are described and characterized. The fractal dimension was determined to be 1.69 +/- 0.07. According to the characterization results, theobserved fractals are compared to the cluster-diffusion-limited-aggregation model. The growth of the fractal patterns in the thin films is also in terms of the existing long-range correlation.

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Documento generato il 26/11/20 alle ore 19:57:36