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Titolo:
NOVEL ANALYSIS SYSTEM OF IMAGING-PLATE PLANE-WAVE X-RAY TOPOGRAPHY FOR CHARACTERIZING LATTICE DISTORTION IN SILICON
Autore:
KUDO Y; KOJIMA S; LIU KY; KAWADO S; ISHIKAWA T;
Indirizzi:
SONY CORP,RES CTR,HODOGAYA KU YOKOHAMA KANAGAWA 240 JAPAN UNIV TOKYO,DEPT ENGN,BUNKYO KU TOKYO 113 JAPAN
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
fascicolo: 6B, volume: 33, anno: 1994,
pagine: 120000823 - 120000825
SICI:
0021-4922(1994)33:6B<120000823:NASOIP>2.0.ZU;2-Z
Fonte:
ISI
Lingua:
ENG
Soggetto:
CRYSTALS;
Keywords:
PLANE-WAVE X-RAY TOPOGRAPHY; SYNCHROTRON RADIATION; IMAGING PLATE; LOCAL LATTICE DISTORTION; ANALYSIS SYSTEM;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
12
Recensione:
Indirizzi per estratti:
Citazione:
Y. Kudo et al., "NOVEL ANALYSIS SYSTEM OF IMAGING-PLATE PLANE-WAVE X-RAY TOPOGRAPHY FOR CHARACTERIZING LATTICE DISTORTION IN SILICON", JPN J A P 2, 33(6B), 1994, pp. 120000823-120000825

Abstract

This letter reports that a novel analysis system has been developed to determine lattice distortion in silicon single crystals from plane-wave X-ray topographs taken using synchrotron radiation. The system analyzes the topographs recorded on the imaging plate and gives the distortion as local variations in spacing and orientation of the lattice plane. Line analysis and mapping of the distortion in any position on the topograph can be easily performed in the system due to the overall digitization by the imaging plate.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/04/20 alle ore 03:13:00