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Titolo:
A STATISTICAL TECHNIQUE FOR CHARACTERIZING X-RAY POSITION-SENSITIVE DETECTORS
Autore:
DUFRESNE E; BRUNING R; SUTTON M; RODRICKS B; STEPHENSON GB;
Indirizzi:
MCGILL UNIV,DEPT PHYS,CTR PHYS MAT,3600 UNIV ST MONTREAL PQ H3A 2T8 CANADA ARGONNE NATL LAB,ADV PHOTON SOURCE ARGONNE IL 60439 IBM CORP,DIV RES,THOMAS J WATSON RES CTR YORKTOWN HTS NY 10598
Titolo Testata:
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
fascicolo: 2, volume: 364, anno: 1995,
pagine: 380 - 393
SICI:
0168-9002(1995)364:2<380:ASTFCX>2.0.ZU;2-I
Fonte:
ISI
Lingua:
ENG
Soggetto:
SYNCHROTRON RADIATION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
20
Recensione:
Indirizzi per estratti:
Citazione:
E. Dufresne et al., "A STATISTICAL TECHNIQUE FOR CHARACTERIZING X-RAY POSITION-SENSITIVE DETECTORS", Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 364(2), 1995, pp. 380-393

Abstract

We present a technique for characterizing X-ray sensitive photodiode arrays and charge-coupled device (CCD) arrays. The technique uses simple statistical estimators (means, variances and correlation functions)to determine the response, noise, resolution and detective quantum efficiency of a position-sensitive detector. We apply this technique by characterizing a linear diode array and a CCD array exposed to direct illumination by X-rays. Correlations between neighboring pixels were important, and they are included in the calculation of the detective quantum efficiency and noise of the detector.

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Documento generato il 11/07/20 alle ore 19:10:22