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Titolo:
GROWTH OF ZINC-SULFIDE THIN-FILMS WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD AS STUDIED BY ATOMIC-FORCE MICROSCOPY
Autore:
KANNIAINEN T; LINDROOS S; PROHASKA T; FRIEDBACHER G; LESKELA M; GRASSERBAUER M; NIINISTO L;
Indirizzi:
HELSINKI UNIV,DEPT CHEM,POB 55 SF-00014 HELSINKI FINLAND VIENNA TECH UNIV,INST ANALYT CHEM A-1060 VIENNA AUSTRIA HELSINKI UNIV TECHNOL,INORGAN & ANALYT CHEM LAB SF-02150 ESPOO FINLAND
Titolo Testata:
Journal of materials chemistry
fascicolo: 7, volume: 5, anno: 1995,
pagine: 985 - 989
SICI:
0959-9428(1995)5:7<985:GOZTWT>2.0.ZU;2-8
Fonte:
ISI
Lingua:
ENG
Soggetto:
ZNS; CDS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
16
Recensione:
Indirizzi per estratti:
Citazione:
T. Kanniainen et al., "GROWTH OF ZINC-SULFIDE THIN-FILMS WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD AS STUDIED BY ATOMIC-FORCE MICROSCOPY", Journal of materials chemistry, 5(7), 1995, pp. 985-989

Abstract

Zinc sulfide thin films have been grown on soda-lime glass and mica substrates using the successive ionic layer adsorption and reaction (SILAR) technique. The film growth was studied by atomic force microscopy(AFM). Both in situ and ex situ techniques were utilized to examine the very first steps of the film growth. The thicker films were examined ex situ only. The investigations were focused on the growth mechanism (i.e. nucleation, formation of agglomerates and the growth mode) as well as on the roughness development of the films. During the growth process the thin films first showed a two-dimensional, then a three-dimensional and finally again a two-dimensional growth mode. The changes in growth mode had a large influence on the roughness of the film. Themaximum root-mean-square (rms) roughness measured was 23 nm after 200cycles of film deposition, but ultimately a smooth, continuous ZnS thin film with an rms roughness of ca. 6 nm was achieved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 27/09/20 alle ore 21:10:00